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New Ion Beam Milling System for Fast and Efficient Site Specific Sample Preparation

Published online by Cambridge University Press:  01 August 2004

Astrid Krehan ,
Alex Vogt  and
W Gruenewald
Astrid Krehan
Affiliation:
BAL-TEC AG, Principality of Leichtenstein
Alex Vogt
Affiliation:
BAL-TEC AG, Principality of Leichtenstein
W Gruenewald
Affiliation:
BAL-TEC Innovation Centre, Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 956 - 957
Copyright
© 2004 Microscopy Society of America

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