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Investigation of the Atomic Structures of Si3N4/CeO2-δ Interfaces using Atomic Resolution Z-contrast Imaging and EELS combined with First-Principles Methods

Published online by Cambridge University Press:  03 August 2008

W Walkosz ,
R Klie ,
S Öǧüt ,
A Borisevich ,
P Becher ,
SJ Pennycook  and
JC Idrobo
W Walkosz
Affiliation:
University of Illinois Chicago
R Klie
Affiliation:
University of Illinois Chicago
S Öǧüt
Affiliation:
University of Illinois Chicago
A Borisevich
Affiliation:
Oak Ridge National Laboratory
P Becher
Affiliation:
Oak Ridge National Laboratory
SJ Pennycook
Affiliation:
Oak Ridge National Laboratory
JC Idrobo
Affiliation:
Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1364 - 1365
Copyright
© 2008 Microscopy Society of America

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