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Microscopy and Microanalysis
Volume 11 Issue s02

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Microscopy and Microanalysis

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Nanostructured materials (54)

Quantitative Characterization, Simulation, and Representation of Microstructures (40)

Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley (38)

Breakthrough Microscopy in Catalysis, Nanoparticles and Energy (33)

High-Resolution STEM Analysis of Functional NanoMaterials (33)

Cell Pathology (32)

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences (32)

Materials Research in an Aberration-Free Environment (30)

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday (30)

Tomography in Biological and Materials Sciences (28)

Microbiology, Pathogenesis and Pathology (24)

Quantitative X-ray Microanalysis (24)

Variable Pressure Electron Microscopy: Advances in the Nanotechnology and Biomaterials Age (24)

Cryo-EM of Molecular Assemblies (22)

Advances in In-situ Electron Microsocpy Technique and Applications (21)

Failure Analysis and Prevention (21)

Botany (20)

From the Static to the Dynamic: Correlative and High Resolution Biological Imaging and Labeling (20)

Presidential Symposium: The Golden Anniversary of Imaging Atoms (20)

Scanned Probe Microscopy and Nanoanalysis: Probing Properties at the Nanoscale (20)

Manipulation of Microstructure to Improve Properties and Performance (19)

Metals and Alloys (19)

Magnetic and Superconducting Materials (18)

Advances in Energy-Filtered Transmission Electron Microscopy (17)

Biological Specimen Preparation (17)

Characterizing the Limits of EBSD Analysis (16)

Microanalysis of Extraterrestrial Materials: New Techniques and Applications (16)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Industry (16)

Scanning Electron Microscopy (SEM) (16)

Semiconductors (16)

Advanced Detectors (15)

Advances in Microstructurial Characterization Techniques (15)

Recent Progress in 3D Microscopy Imaging (14)

Spectral Imaging: Advances and Applications (14)

Advances in Instrumentation and Technique (13)

Advances in Ultrastructural Studies at Low Temperatures for Cryo TEM and SEM (13)

Interfaces (13)

Radiation Effects in Materials (13)

Reproduction and Development (13)

Structural Biology (13)

Biomaterials and Tissue Engineering (12)

Nano Scale Engineering & Self Assembly (12)

Vascular Corrosion Casting (12)

Modes of Cell-Cell and Cell-ECM Communication (11)

Digital Imaging (10)

Phase Transformations (10)

Green Fluorescent Protein and its Relatives (9)

Metallographic Techniques and Applications (9)

Advances in Fluorescence, Flow Cytometry and Cytomics (8)

Confocal Microscopy (8)

Microscopy and Imaging in the Digital Age (8)

Oxidation (8)

STEM Cells (8)

Films / Coatings (7)

Geology (7)

Ultrafast Electron Diffraction and Microscopy (7)

Composites (6)

Particle Analysis (6)

Specimen Preparation for Materials Sciences (6)

Technologists’ Forum: Low Temperature Technologies for Electron Microscopy (6)

Fluorescence (Förster) Resonance Energy Transfer (FRET) Microscopy (5)

Ceramics (4)

Core Facility Management (4)

Crystallography (4)

Polymers (4)

Ferroelectrics (3)

Corporate Session (2)

Industrial Real World Microscopy (2)

Building Order in Large Image Data Sets: Classification Techniques at Work! (1)

Computational Tools for Interpreting Electron Tomograms (1)

Confocal Microscopy System Performance: Spectroscopy and Foundations for Quantitation (1)

Improved Electron Microscopy with Monte Carlo Simulations (1)

In-situ Electron Microscopy: A Practical Tutorial (1)

Quantum Dots as Cellular Probes for Light and Electron Microscopy (1)

Theory and Applications of Focal-Series Reconstruction in HRTEM (1)

What is Fluctuation Electron Microscopy? (1)

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Microscopy and Microanalysis
ISSN: 1431-9276

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< Back to all issues

Volume 11 - Issue S02 - August 2005

Contents

Page 33 of 54

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Quantitative X-ray Microanalysis

Research Article

Testing Win X-ray, a Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope
H Campbell, R Gauvin
Published online by Cambridge University Press:

01 August 2005, pp. 1288-1289
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Spectrum Simulation with NISTMonte
N W M Ritchie
Published online by Cambridge University Press:

01 August 2005, pp. 1290-1291
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Not-So-Routine Electron Probe Microanalyses of Jarosite
H Lowers, G Desborough, J Hammarstrom, G Swayze, K Smith, S Diehl
Published online by Cambridge University Press:

01 August 2005, pp. 1292-1293
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

NanoZAF-A Pocket-Sized Utility for Microanalytical Experiment Design
N M W Ritchie
Published online by Cambridge University Press:

01 August 2005, pp. 1294-1295
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Quantifying Heterogeneity in the Pu-Ga System
C C Davis, R E Lakis
Published online by Cambridge University Press:

01 August 2005, pp. 1296-1297
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microanalysis of Very Fine Precipitates by FE-SEM
A M Elwazri, R Varano, F Siciliano, R Gauvin, S Yue
Published online by Cambridge University Press:

01 August 2005, pp. 1298-1299
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Element Ratio Maps: A More Informative Use Of Digital Elemental X-ray Maps Than Single Element Maps
C S Schwandt, G A McKay
Published online by Cambridge University Press:

01 August 2005, pp. 1300-1301
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Examination of Interfacial Reactions of a NiAl-Hf-hBN System on a Sapphire Fibre by a Combination of EPMA and FIB Specimen Preparation
S Richter, S Kyrsta, D Hajas, J Schneider, J Mayer
Published online by Cambridge University Press:

01 August 2005, pp. 1302-1303
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microanalysis of Hafnian Zircon
C Ma, G R Rossman
Published online by Cambridge University Press:

01 August 2005, pp. 1304-1305
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Measuring the Thickness of Native Plutonium Oxides Using EPMA
T Nothwang, C C Davis, R E Lakis
Published online by Cambridge University Press:

01 August 2005, pp. 1306-1307
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Electron Probe Microanalysis of Cr Films on Semiconducting and Insulating Substrates
M S Hatzistergos, E Lifshin
Published online by Cambridge University Press:

01 August 2005, pp. 1308-1309
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Evaluation of Uncertainties in Dating of Monazite by Electron Microprobe
C Merlet
Published online by Cambridge University Press:

01 August 2005, pp. 1310-1311
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Quantitative Electron Probe Microanalysis of Si-Ge Reference Materials
R B Marinenko, S Turner, D E Newbury, L Richter, L Yu, R Zeisler, D Simons
Published online by Cambridge University Press:

01 August 2005, pp. 1312-1313
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

A Multiple Collision and Finite Volume Code for Photon Transport Simulation
M Sumini, F Teodori, J E Fernandez, V Molinari
Published online by Cambridge University Press:

01 August 2005, pp. 1314-1315
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday

Research Article

Laudatio for Joseph I. Goldstein on the Occasion of his 65th Birthday: Contributions to Meteoritics, Cosmochemistry, and Lunar Science
K Keil
Published online by Cambridge University Press:

01 August 2005, pp. 1316-1317
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

SEMXM—Past, Present, and Future
J I Goldstein
Published online by Cambridge University Press:

01 August 2005, pp. 1318-1319
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

The Process of Interpreting Images Obtained by Scanning Electron Microscopy
P Echlin
Published online by Cambridge University Press:

01 August 2005, pp. 1320-1321
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Nano- and Microscale Engineering of Sensors
A D Romig Jr, B K Cloer
Published online by Cambridge University Press:

01 August 2005, pp. 1322-1323
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

EBSD Characterization of Materials: From Meteorites to Welds to MEMS
J R Michael, J I Goldstein
Published online by Cambridge University Press:

01 August 2005, pp. 1324-1325
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microscopy of Materials Used in the Semiconductor Industry
S M Merchant, J M DeLucca, K N Hooghan, F A Baiocchi
Published online by Cambridge University Press:

01 August 2005, pp. 1326-1327
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

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