Crossref Citations
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Stanford, J.A.
Teslich, N.
Donald, S.
Saw, C.K.
Gollott, R.
and
Dinh, L.N.
2020.
Measurement of PuO2 film thickness by electron probe microanalysis (EPMA) calibration curve method.
Journal of Nuclear Materials,
Vol. 530,
Issue. ,
p.
151968.
Llovet, Xavier
Moy, Aurélien
Pinard, Philippe T.
and
Fournelle, John H.
2021.
Electron probe microanalysis: A review of recent developments and applications in materials science and engineering.
Progress in Materials Science,
Vol. 116,
Issue. ,
p.
100673.
Llovet, Xavier
Moy, Aurélien
Pinard, Philippe T.
and
Fournelle, John H.
2021.
Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering.
Progress in Materials Science,
Vol. 120,
Issue. ,
p.
100818.