Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Login Alert

Log in

×

×

Back to search results

Home
Journals
Microscopy and Microanalysis
Volume 11 Issue s02

English
Français

Microscopy and Microanalysis

Add bookmark

Share

Search within full text

Other actions

Journal Home

Journal home
Micrographia
Sample content
Collections
FirstView articles
Latest issue
All issues
Most cited

Refine listing

Refine listing

Access:

Only show content I have access to (1078)

Publication date:

Over 3 years (1078)

Topic: Show more

Nanostructured materials (54)

Quantitative Characterization, Simulation, and Representation of Microstructures (40)

Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley (38)

Breakthrough Microscopy in Catalysis, Nanoparticles and Energy (33)

High-Resolution STEM Analysis of Functional NanoMaterials (33)

Cell Pathology (32)

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences (32)

Materials Research in an Aberration-Free Environment (30)

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday (30)

Tomography in Biological and Materials Sciences (28)

Microbiology, Pathogenesis and Pathology (24)

Quantitative X-ray Microanalysis (24)

Variable Pressure Electron Microscopy: Advances in the Nanotechnology and Biomaterials Age (24)

Cryo-EM of Molecular Assemblies (22)

Advances in In-situ Electron Microsocpy Technique and Applications (21)

Failure Analysis and Prevention (21)

Botany (20)

From the Static to the Dynamic: Correlative and High Resolution Biological Imaging and Labeling (20)

Presidential Symposium: The Golden Anniversary of Imaging Atoms (20)

Scanned Probe Microscopy and Nanoanalysis: Probing Properties at the Nanoscale (20)

Manipulation of Microstructure to Improve Properties and Performance (19)

Metals and Alloys (19)

Magnetic and Superconducting Materials (18)

Advances in Energy-Filtered Transmission Electron Microscopy (17)

Biological Specimen Preparation (17)

Characterizing the Limits of EBSD Analysis (16)

Microanalysis of Extraterrestrial Materials: New Techniques and Applications (16)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Industry (16)

Scanning Electron Microscopy (SEM) (16)

Semiconductors (16)

Advanced Detectors (15)

Advances in Microstructurial Characterization Techniques (15)

Recent Progress in 3D Microscopy Imaging (14)

Spectral Imaging: Advances and Applications (14)

Advances in Instrumentation and Technique (13)

Advances in Ultrastructural Studies at Low Temperatures for Cryo TEM and SEM (13)

Interfaces (13)

Radiation Effects in Materials (13)

Reproduction and Development (13)

Structural Biology (13)

Biomaterials and Tissue Engineering (12)

Nano Scale Engineering & Self Assembly (12)

Vascular Corrosion Casting (12)

Modes of Cell-Cell and Cell-ECM Communication (11)

Digital Imaging (10)

Phase Transformations (10)

Green Fluorescent Protein and its Relatives (9)

Metallographic Techniques and Applications (9)

Advances in Fluorescence, Flow Cytometry and Cytomics (8)

Confocal Microscopy (8)

Microscopy and Imaging in the Digital Age (8)

Oxidation (8)

STEM Cells (8)

Films / Coatings (7)

Geology (7)

Ultrafast Electron Diffraction and Microscopy (7)

Composites (6)

Particle Analysis (6)

Specimen Preparation for Materials Sciences (6)

Technologists’ Forum: Low Temperature Technologies for Electron Microscopy (6)

Fluorescence (Förster) Resonance Energy Transfer (FRET) Microscopy (5)

Ceramics (4)

Core Facility Management (4)

Crystallography (4)

Polymers (4)

Ferroelectrics (3)

Corporate Session (2)

Industrial Real World Microscopy (2)

Building Order in Large Image Data Sets: Classification Techniques at Work! (1)

Computational Tools for Interpreting Electron Tomograms (1)

Confocal Microscopy System Performance: Spectroscopy and Foundations for Quantitation (1)

Improved Electron Microscopy with Monte Carlo Simulations (1)

In-situ Electron Microscopy: A Practical Tutorial (1)

Quantum Dots as Cellular Probes for Light and Electron Microscopy (1)

Theory and Applications of Focal-Series Reconstruction in HRTEM (1)

What is Fluctuation Electron Microscopy? (1)

Classifications

Actions for selected content:

Select all | Deselect all

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Search Title: required Please provide a title, maximum of 40 characters.

×

< Back to all issues

Volume 11 - Issue S02 - August 2005

Contents

Page 36 of 54

First
« Prev
33
34
35
36
37
38
39
Next »
Last

Nano Scale Engineering & Self Assembly

Research Article

Template Synthesis of Ordered Pt Nanorods in Porous Anodic Alumina
Y-M Wang, H-H Kuo, M Verbrugge, J Lian, L Wang, W Zhou
Published online by Cambridge University Press:

01 August 2005, pp. 1408-1409
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Importance of Aromatic Content for Peptide/Single-Walled Carbon Nanotube Interactions
V Zorbas, A L Smith, A Ortiz-Acevedo, H Xie, G R Dieckmann, R K Draper, R H Baughman, I H Musselman
Published online by Cambridge University Press:

01 August 2005, pp. 1410-1411
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Growth of Carbon Nanotubes from Supported Metal Catalysts
Z Aslam, B Rand, R Brydson, A Brown, X Li
Published online by Cambridge University Press:

01 August 2005, pp. 1412-1413
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Structural Characterization of Carbon Nanotube Arrays Formed in Ultra-Long Nanochannels of Porous Alumina Templates
J Y Miao, Y Cai, Y F Chan, N Wang
Published online by Cambridge University Press:

01 August 2005, pp. 1414-1415
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

High-Resolution STEM Analysis of Functional NanoMaterials

Research Article

Nanostructure Functionality through Aberration-Corrected STEM
S J Pennycook, M F Chisholm, A R Lupini, Y Peng, K van Benthem, A Borisevich, S D Findlay, M P Oxley, L J Allen, M Varela
Published online by Cambridge University Press:

01 August 2005, pp. 1416-1417
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Cobalt Disilicide/Silicon(001) Interfaces
A Bleloch, M Falke, U Falke
Published online by Cambridge University Press:

01 August 2005, pp. 1418-1419
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Interpretation of High Resolution Scanning Transmission Electron Microscope Images Based on Core Loss Spectroscopy
M P Oxley, S D Findlay, L J Allen
Published online by Cambridge University Press:

01 August 2005, pp. 1420-1421
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Nion UltraSTEM: An Aberration-Corrected STEM for Imaging and Analysis
N J Bacon, G J Corbin, N Dellby, P Hrncirik, O L Krivanek, A McManama-Smith, M F Murfitt, Z S Szilagyi
Published online by Cambridge University Press:

01 August 2005, pp. 1422-1423
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Z-contrast STEM Imaging of Rare Earths Segregation at Crystal/Intergranular Film Interfaces in Si3N4 CeramicI
N Shibata, G S Painter, P F Becher, S J Pennycook
Published online by Cambridge University Press:

01 August 2005, pp. 1424-1425
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Imaging Dislocations in Complex Materials
M F Chisholm, S Kumar, P M Hazzledine
Published online by Cambridge University Press:

01 August 2005, pp. 1426-1427
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

The Aberration Corrected JEM-2200FS at Brookhaven
Y Zhu, R F Klie, T Tomita, H Sawada, K Nagahata
Published online by Cambridge University Press:

01 August 2005, pp. 1428-1429
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Deconvolution Processing in Analytical STEM: Monochromator for EELS and Cs-Corrector for STEM-HAADF
K Ishizuka
Published online by Cambridge University Press:

01 August 2005, pp. 1430-1431
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Atomic Scale Studies of the Electronic Properties of CMR Manganese Oxides
M Varela, V Peña, Z Sefrioui, W Tian, A R Lupini, D G Mandrus, J Santamaria, S J Pennycock
Published online by Cambridge University Press:

01 August 2005, pp. 1432-1433
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

High Spatial and Energy Resolution EELS using a Monochromated STEM
N D Browning, R P Erni, A Ziegler, J C Idrobo, C F Kisielowski, R O Ritchie
Published online by Cambridge University Press:

01 August 2005, pp. 1434-1435
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

STEM- and EFTEM-Analysis of Nanomaterials at High Spatial and High Energy Resolution
W Grogger, B Schaffer, M Rogers, G Kothleitner, F Hofer
Published online by Cambridge University Press:

01 August 2005, pp. 1436-1437
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Radiolytic Transformation of TiO2 Revisited with High Resolution EELS
J Neff, R R Vanfleet
Published online by Cambridge University Press:

01 August 2005, pp. 1438-1439
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Novel Method for 3d Transition Metal L2,3 ELNES by First Principles Multi-Electron Theory
H Ikeno, T Mizoguchi, Y Koyama, I Tanaka
Published online by Cambridge University Press:

01 August 2005, pp. 1440-1441
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Why Some Interfaces can Never be Sharp
D A Muller, N Nakagawa, H Y Hwang
Published online by Cambridge University Press:

01 August 2005, pp. 1442-1443
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Chemical Bonding Information from ELNES using Bond Overlap Population Diagram
T Mizoguchi, I Tanaka
Published online by Cambridge University Press:

01 August 2005, pp. 1444-1445
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

HAADF Imaging and Low-Loss EELS Investigation of HfO2/TiN Interfaces in High-k Gate Stacks
M P Agustin, L R C Fonseca, J H Hooker, S Stemmer
Published online by Cambridge University Press:

01 August 2005, pp. 1446-1447
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 36 of 54

First
« Prev
33
34
35
36
37
38
39
Next »
Last

Our Site

Accessibility
Contact & Help
Legal Notices

Our Platforms

Cambridge Core
Cambridge Open Engage
Cambridge Higher Education

Our Products

Journals
Books
Elements
Textbooks
Courseware

Join us online

Location

Please choose a valid location.

Rights & Permissions
Copyright
Privacy Notice
Terms of Use
Cookies Policy

Cambridge University Press 2024

×