Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

Using 3D Nanotomography to Visualize Defects in the Fabrication of Superconducting Electronics

In situ Femtosecond Laser and Argon Ion Beams for 3D Microanalysis using the TriBeam

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Using Ultrafast X-ray Lasers to Image Structure & Dynamics

Studying Shocked Material Dynamics with Ultrafast X-rays

Imaging Irreversible Transformations with Movie-Mode Dynamic Transmission Electron Microscopy

Dynamic Transmission Electron Microscope Study on the Crystallization of Ion-Bombarded Amorphous Germanium Thin Films

A06 Advanced Analytical TEM/STEM

Abstract

Simultaneous High-Speed DualEELS and EDS acquisition at atomic level across the LaFeO3 / SrTiO3 interface

Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS

Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope

STEM in 4 Dimensions: Using Multivariate Analysis of Ptychographic Data to Reveal Material Functionality

Resolution Assessment of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope

Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector *

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

Nanoscale Chemical Imaging via AFM coupled IR Spectroscopy

Introducing Nano-FTIR - Imaging and Spectroscopy at 10nm Spatial Resolution

New Hybrid Peak-Force Tapping/Near-Field Microscope for Nano-Chemical and Nano-Mechanical Imaging of Graphene Plasmons, Polymers and Proteins

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Quantitative Electron-Excited X-ray Microanalysis at Low Beam Energy

Comparing the Intensities and Spectral Resolution Achieved by Wavelength-Dispersive Spectrometers on Electron Microprobes and SEMs

Evaluation of Combined Quantification of Cr-Ni Steel using EDS and WDS

Comparison of WDS and EDS Rare Earth Element Analysis

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Real-Space Simulation of Electron Scattering in Imperfect Crystals and Reconstruction of the Electrostatic Potential

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract