Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-29T08:20:50.058Z Has data issue: false hasContentIssue false
  • English
  • Français

In situ Femtosecond Laser and Argon Ion Beams for 3D Microanalysis using the TriBeam

Published online by Cambridge University Press:  23 September 2015

M.P. Echlin ,
W.C. Lenthe ,
J. Douglas ,
M. Titus ,
R. Guerts ,
M. Straw  and
T.M. Pollock
M.P. Echlin
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA
W.C. Lenthe
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA
J. Douglas
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA
M. Titus
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA
R. Guerts
Affiliation:
FEI Company
M. Straw
Affiliation:
FEI Company
T.M. Pollock
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1847 - 1848
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Ma, S., et al, Met. Mat. Trans. A 38 (2007). p 2349–2357.Google Scholar
[2] Feng, Q., et al, Scripta Mat 53(5 (2005). p 511–516.Google Scholar
[3] Echlin, M.P., et al, Materials Characterization: Tutorial Review 100 (2015) 1–12.Google Scholar
[4] Giannuzzi, L.A., et al, Microscopy and Microanalysis 11 (2005) 828–829.Google Scholar