Microscopy and Microanalysis: Volume 26 - Issue S2

Only show content I have access to (1120)

Over 3 years (1121)

Plenary Session (2)

Author Index (1)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 26 - Supplement S2 - August 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

Modulated Nanostructure Characterization Using Aberration Corrected STEM

Multiscale Evolution of Strain Localisation Mechanisms in AZ31B Magnesium and 7050 Aluminum Alloys at High Strain Rates

Characterization of Failure Surfaces of Epoxy Adhesive Under Varying Quasi-Static Loading Conditions

New Frontiers in Electron Microscopy of Two-dimensional Materials

In-Situ Atomic Level Studies of Unusual Phase Transformations in Metal-chalcogenide 2D Crystals

2D Noble Gas Crystals Encapsulated in Few-layer Graphene

Stable Continuously Variable Temperature Cryo-STEM to Understand the Structurally Driven Phase Transition in the 2D Layered Magnet Nb3Br8

Nucleation and Growth of Metal Films and Nanocrystals on Two-dimensional Materials

In-situ TEM Investigation of Lithiation and Sodiation of 2D Metal Sulfides

Advanced Characterization of Nuclear Fuels and Materials

Microstructural Characterization of Irradiated U-Pu-Zr Fuels

Detecting Thermally Induced Spinodal Decomposition with Picosecond Ultrasonics in Cast Austenitic Stainless Steels

Resolving Atomic Transport Through Iron Oxide Under Irradiation Using Isotopic Tracers

Towards an End-to-end Radiation Defect Quantitative Characterization Workflow Using Advanced Microscopy Images

Texture Analyses and Microstructural Evolution in Irradiated Monolithic U-Mo Nuclear Fuel

In situ TEM at the Extremes - Multi-beam

In Situ Laser Synthesis of 2D WSe2 Within TEM

Simulation Analysis of Atomic Scale Optical Imaging by Combing Photoexcitation and Electron Microscopy

Femtosecond TEM: Imaging Nanoscale Materials Dynamics at Temporal Extremes

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Novel Approaches for Electron Tomography to Investigate the Structure and Stability of Nanomaterials in 3 Dimensions.

Polarization in Ferroelectric BiFeO3 Imaged in 3D Using Four-dimensional Scanning Transmission Electron Microscopy

Quantitative 3D Characterization of Novel Polymer-nanocrystal Hybrid Catalysts by Electron Tomography

Three Dimensional Structure of Grain Boundaries in Nanometals

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 26 - Supplement S2 - August 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

New Frontiers in Electron Microscopy of Two-dimensional Materials

Advanced Characterization of Nuclear Fuels and Materials

In situ TEM at the Extremes - Multi-beam

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering