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Modulated Nanostructure Characterization Using Aberration Corrected STEM

Published online by Cambridge University Press:  30 July 2020

Ray Carpenter ,
Ronit Sawant  and
Toshihiro Aoki
Ray Carpenter
Affiliation:
Arizona State University, Mesa, Arizona, United States
Ronit Sawant
Affiliation:
Arizona State University, Tempe, Arizona, United States
Toshihiro Aoki
Affiliation:
University of California - Irvine, Irvine, California, United States

Abstract

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Type
Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1074 - 1076
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Copyright
Copyright © Microscopy Society of America 2020

References

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