Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Plenary Session

Abstract

In-situ and Cryogenic Electron Microscopy for Energy Materials

Melanin Through Deep Time: Experimental and Analytical Approaches to Decoding the Fossil Record of Melanin

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Causal Learning from Structural and Spectral Electron Microscopy Data

Machine Learning for Phase Retrieval from 4D-STEM Data

High Throughput Crystal Structure Classification

Detecting Vacancy-Induced Strain Field Oscillations via Deep Learning

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

Direct Mapping of Electrostatic Potentials by Momentum-resolved STEM and Electron Holography - A Conceptual Comparison

Multislice Electron Scattering Simulations for Angstrom-scale Magnetic Measurements with 4D-STEM

Sensitivity of 4D-STEM to Valence Electron Distribution Based on Multipole Density Formalism

Efficient Phase-contrast Imaging via Mixed-state Electron Ptychography: From Crystal Structures to Electromagnetic Fields

Crystallography at the Nanoscale and MicroED with Electrons and X-rays

MicroED: Conception, Practice and Future Opportunities

Nanocartography in the Age of Automated TEM

Novel Core-shell Nanoscale Precipitates in High Performance PbSe-CdSe Thermoelectric Materials

“Crystallography” of an Amorphous Material Using Electron Nanodiffraction

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

Investigation of N in Ammonium-bearing Silicates with Electron Probe Microanalysis (EPMA)

Quantitative Electron-excited X-ray Microanalysis with Low Energy L-Peaks

Using Calibration Curves to Quantify Fe with the Soft Lα and Lβ X-ray Lines

Quantitative Microanalysis of Chromites and Garnets at Low kV Using Fe and Cr Lα and Lβ X-ray Lines

The EPMA Matrix Correction: All Elements Must Be Present for Accuracy: Four Examples with B, C, O and F

X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis

Total X-ray Intensity Images of Mouse's Femoral Epiphysis and Incisor Tooth from SEM-EDS

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Plenary Session

Abstract

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

Crystallography at the Nanoscale and MicroED with Electrons and X-rays

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis