Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-27T02:53:30.637Z Has data issue: false hasContentIssue false
  • English
  • Français

“Crystallography” of an Amorphous Material Using Electron Nanodiffraction

Published online by Cambridge University Press:  30 July 2020

Carter Francis ,
Debaditya Chatterjee ,
Sachin Muley  and
Paul Voyles
Carter Francis
Affiliation:
University of Wisconsin - Madison, Madison, Wisconsin, United States
Debaditya Chatterjee
Affiliation:
University of Wisconsin - Madison, Madison, Wisconsin, United States
Sachin Muley
Affiliation:
University of Wisconsin - Madison, Madison, Wisconsin, United States
Paul Voyles
Affiliation:
University of Wisconsin - Madison, Madison, Wisconsin, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 38 - 40
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Hwang, J., Melgarejo, Z. H., Kalay, Y. E., Kalay, I., Kramer, M. J., Stone, D. S., Voyles, P. M., Phys. Rev. Lett. 2012, 108, 1.Google Scholar
Zhang, P., Maldonis, J. J., Besser, M. F., Kramer, M. J., Voyles, P. M., Acta Mater. 2016, 109, 103.10.1016/j.actamat.2016.02.006CrossRefGoogle Scholar
Liu, A. C. Y., Neish, M. J., Stokol, G., Buckley, G. A., Smillie, L. A., de Jonge, M. D., Ott, R. T., Kramer, M. J., Bourgeois, L., Phys. Rev. Lett. 2013, 110, 205505.10.1103/PhysRevLett.110.205505CrossRefGoogle Scholar
Gibson, J. M., Treacy, M. M. J., Sun, T., Zaluzec, N. J., Phys. Rev. Lett. 2010, 105, 125504.10.1103/PhysRevLett.105.125504CrossRefGoogle Scholar
Im, S., Chen, Z., Johnson, J. M., Zhao, P., Yoo, G. H., Park, E. S., Wang, Y., Muller, D. A., Hwang, J., Ultramicroscopy 2018, 195, 189.10.1016/j.ultramic.2018.09.005CrossRefGoogle Scholar
Du, Q., Liu, X., Fan, H., Zeng, Q., Wu, Y., Wang, H., Chatterjee, D., Ren, Y., Ke, Y., Voyles, P. M., Lu, Z., Ma, E., Mater. Today 2019, DOI 10.1016/j.mattod.2019.09.002.Google Scholar