Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-27T00:35:45.969Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of Combined Mean Atomic Number Backgrounds and Blank Corrections to EPMA Trace Element Measurements: Successes and Challenges

Published online by Cambridge University Press:  05 August 2019

Owen K. Neill ,
Nikita L. La Cruz ,
David Hernández Uribe ,
Jameson S. R. Jolles ,
Joseph R. Boro  and
John J. Donovan
Owen K. Neill*
Affiliation:
School of Earth and Environmental Sciences, University of Michigan, Ann Arbor, MI, USA.
Nikita L. La Cruz
Affiliation:
School of Earth and Environmental Sciences, University of Michigan, Ann Arbor, MI, USA.
David Hernández Uribe
Affiliation:
Department of Geology and Geological Engineering, Colorado School of Mines, Golden, CO, USA.
Jameson S. R. Jolles
Affiliation:
School of Earth and Environmental Sciences, University of Michigan, Ann Arbor, MI, USA.
Joseph R. Boro
Affiliation:
School of the Environment, Washington State University, Pullman, WA, USA
John J. Donovan
Affiliation:
CAMCOR, University of Oregon, Eugene, OR, USA.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Characterization of Geological and Extraterrestrial Samples
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2478 - 2479
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Donovan, JJ, Singer, JW and Armstrong, JT, Am Mineral 101 (2016), p. 1839-1853.Google Scholar
[2]Donovan, JJ and Tingle, TN, J Microsc Microanal, 8 (1996), p. 1-7.Google Scholar
[3]Kramers, HA, Phil Mag, 46 (1923), p. 836.Google Scholar
[4]Donovan, JJ, Lowers, HA and Rusk, BG, Am Mineral 96(2-3) (2011), p. 274-282.Google Scholar