Back to the basics: The fundamentals of cryo-electron microscopy

T Dokland

doi:10.1017/S1431927609099280

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Back to the basics: The fundamentals of cryo-electron microscopy

Published online by Cambridge University Press: 26 July 2009

T Dokland

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T Dokland*: Affiliation:
University of Alabama,Birmingham

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1538 - 1539

DOI: https://doi.org/10.1017/S1431927609099280 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2009

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Back to the basics: The fundamentals of cryo-electron microscopy

Volume 15, Supplement S2
T Dokland ^(a1)
DOI: https://doi.org/10.1017/S1431927609099280

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Back to the basics: The fundamentals of cryo-electron microscopy

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