Microscopy and Microanalysis: Volume 13 - Issue S03

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Volume 13 - Issue S03 - September 2007

Contents

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Research Article

The Calculation of Inelastic Electron Scattering in TEM within Second Order QED Perturbation Theory
A Rother
Published online by Cambridge University Press:

07 September 2007, pp. 42-43
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Quantitative and Automated Analysis of HR-TEM Electron Exit Plane Waves using the EWAC Code
Svete M, Mader W
Published online by Cambridge University Press:

07 September 2007, pp. 44-45
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Low-loss EELS Measurements with Monochromated Electrons
Kothleitner G, Grogger W, Hofer F, Schaffer B
Published online by Cambridge University Press:

07 September 2007, pp. 46-47
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

New Electron Energy Loss Magnetic Chiral Dichroïsm (EMCD) configuration using an aberration-corrected transmission electron microscope
Houdellier F, Warot-Fonrose B, Hÿtch M J, CEMES-CNRS, France
Published online by Cambridge University Press:

07 September 2007, pp. 48-49
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Structural Investigation using Fe-L2,3 Energy-Loss Near-Edge Fine Structures Recorded by High Energy-Resolution EELS
Schmid H, Assenmacher W, Mader W, Irsen S
Published online by Cambridge University Press:

07 September 2007, pp. 50-51
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

EELS and ab-initio Simulations to Study Magnetic Devices
Serin V, Calmels L, Serra R, Warot-Fonrose B, Houdellier F, Snoeck E, Colliex Ch, Varela M
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07 September 2007, pp. 52-53
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Low-loss EELS with Monochromated Electrons
Sigle W, Gu L, Srot V, Koch Ch, Aken P A van
Published online by Cambridge University Press:

07 September 2007, pp. 54-55
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Treating Correlated Noise in Model Based Quantification of EELS Spectra
J Verbeeck, G Bertoni
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07 September 2007, pp. 56-57
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007.

A Program to Optimize the Positions and the Width of the Energy Windows for the Recording of EFTEM Elemental Maps
B Gralla, H Kohl
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07 September 2007, pp. 58-59
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Investigations on Energy-Spectroscopic Diffraction Patterns
C Prietzel, H Kohl
Published online by Cambridge University Press:

07 September 2007, pp. 60-61
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Relativistic Ionisation Cross-Sections for use in Microanalysis
A-K Rokahr, F Pokroppa, H Kohl
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07 September 2007, pp. 62-63
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

EFTEM with omega-type Monochromator – the most advanced analytical tool
H Stegmann, M Matijevic, E Essers, G Benner
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07 September 2007, pp. 64-65
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Time Resolved PEEM: Observation of Standing and Propagating Spinwave Modes and Surface-Plasmon Oscillations
G Schönhense
Published online by Cambridge University Press:

07 September 2007, pp. 66-67
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

The role of long-range interactions and critical behavior in determining surface morphologies: a combined LEEM/SXRD study
R van Gastel
Published online by Cambridge University Press:

07 September 2007, pp. 68-69
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Chemical Patterning and Chemical Contrast Imaging with the Tip of an Atomic Force Microscope
T Schimmel
Published online by Cambridge University Press:

07 September 2007, pp. 70-71
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007.

Imaging Magnetic Nanostructures by Resonant X-Ray Holography
S Eisebitt
Published online by Cambridge University Press:

07 September 2007, pp. 72-73
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Characterization of a 4-Quadrant-Large-Angles BSE-Detector for in-situ 3D Quantitative Analysis of the Sample Morphology in SEM
D Berger
Published online by Cambridge University Press:

07 September 2007, pp. 74-75
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Non-conductive sample charging in SEM and ESEM
H-J Fitting, M Touzin, N Cornet, D Goeuriot, D Juvé, C Guerret-Piécourt
Published online by Cambridge University Press:

07 September 2007, pp. 76-77
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Strategies for Collection of Secondary Electrons in the SEM
I Konvalina, M Hovorka, P Wandrol, F Mika, I Müllerová
Published online by Cambridge University Press:

07 September 2007, pp. 78-79
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

High-Resolution Scanning Electron Microscope for Mass Determination: Progress in the Development of a New Nanoanalytical Tool
V Krzyzanek, R Reichelt
Published online by Cambridge University Press:

07 September 2007, pp. 80-81
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Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Page 2 of 12

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4
5
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Next »
Last

Microscopy and Microanalysis

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Volume 13 - Issue S03 - September 2007

Research Article

The Calculation of Inelastic Electron Scattering in TEM within Second Order QED Perturbation Theory

Quantitative and Automated Analysis of HR-TEM Electron Exit Plane Waves using the EWAC Code

Low-loss EELS Measurements with Monochromated Electrons

New Electron Energy Loss Magnetic Chiral Dichroïsm (EMCD) configuration using an aberration-corrected transmission electron microscope

Structural Investigation using Fe-L2,3 Energy-Loss Near-Edge Fine Structures Recorded by High Energy-Resolution EELS

EELS and ab-initio Simulations to Study Magnetic Devices

Low-loss EELS with Monochromated Electrons

Treating Correlated Noise in Model Based Quantification of EELS Spectra

A Program to Optimize the Positions and the Width of the Energy Windows for the Recording of EFTEM Elemental Maps

Investigations on Energy-Spectroscopic Diffraction Patterns

Relativistic Ionisation Cross-Sections for use in Microanalysis

EFTEM with omega-type Monochromator – the most advanced analytical tool

Time Resolved PEEM: Observation of Standing and Propagating Spinwave Modes and Surface-Plasmon Oscillations

The role of long-range interactions and critical behavior in determining surface morphologies: a combined LEEM/SXRD study

Chemical Patterning and Chemical Contrast Imaging with the Tip of an Atomic Force Microscope

Imaging Magnetic Nanostructures by Resonant X-Ray Holography

Characterization of a 4-Quadrant-Large-Angles BSE-Detector for in-situ 3D Quantitative Analysis of the Sample Morphology in SEM

Non-conductive sample charging in SEM and ESEM

Strategies for Collection of Secondary Electrons in the SEM

High-Resolution Scanning Electron Microscope for Mass Determination: Progress in the Development of a New Nanoanalytical Tool

Microscopy and Microanalysis

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Volume 13 - Issue S03 - September 2007

Research Article