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Electron Traps in n-GaN Grown on Si (111) Substrates by MOVPE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1068 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1068-C06-09
- Print publication:
- 2008
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- Article
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Impurities of Epoxy Novolac Resins and their Influence on the Reliability of Encapsulated Semiconductors.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 72 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 205
- Print publication:
- 1986
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- Article
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