15 results
Evaluation of Environmental Imaging for 200kV Field Emission Cs-corrected Analytical Scanning and Transmission Electron Microscope for Multi-User Facilities
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 918-919
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- July 2017
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STEM and TEM: Disparate Magnification Definitions and a Way Out.
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 56-57
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- July 2017
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Aberration Corrected Analytical Scanning and Transmission Electron Microscope for High-Resolution Imaging and Analysis for Multi-User Facilities
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 32-33
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- July 2016
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Letter to the Editor
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- Acta Neuropsychiatrica / Volume 15 / Issue 2 / April 2003
- Published online by Cambridge University Press:
- 24 June 2014, p. 102
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The Development of A Large-Area Windowless Energy Dispersive X-ray Detector for STEM-EDX Analysis
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1192-1193
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- August 2013
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Split-illumination electron holography
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1368-1369
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- August 2013
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Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 388-389
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- July 2012
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Reduce the electron damage in atomic resolved SEM observation using aberration corrected electron microscope.
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 374-375
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- July 2012
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A Method for Site-specific Specimen Preparation of Si Device after 65 nm-node Technology using FIB-STEM/TEM System
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 790-791
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- August 2007
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Atomic Scale Imaging and High Sensitive Elemental Analysis with an Aberration Corrected Dedicated STEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 886-887
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- August 2007
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Molecular and serological characterization of adenovirus genome type 7h isolated in Japan
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- Epidemiology & Infection / Volume 122 / Issue 2 / April 1999
- Published online by Cambridge University Press:
- 01 April 1999, pp. 281-286
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Oxygenation characteristics in high-density YBa2Cu3Ox ceramics
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- Journal of Materials Research / Volume 6 / Issue 7 / July 1991
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- 31 January 2011, pp. 1398-1403
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- July 1991
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Formation of High Quality GaAs/Si Hetero-Structure by Solid Phase Epitaxy
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- MRS Online Proceedings Library Archive / Volume 144 / 1988
- Published online by Cambridge University Press:
- 26 February 2011, 273
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- 1988
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Rapid Thermal Annealing of Se-Implanted Gallium Arsenide
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- MRS Online Proceedings Library Archive / Volume 92 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 431
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- 1987
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EPITAXIAL GROWTH OF NICKEL SILICIDE LAYERS ON SILICON BY ELECTRON BEAM ANNEALING
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- MRS Online Proceedings Library Archive / Volume 56 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 171
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- 1985
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