29 results
Teaching Electron Microscopy; A Variety of Options for a Diverse Range of Students
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2268-2269
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- August 2019
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Quantitative Analysis of Sulfur in Polymer Materials
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 789-790
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- August 2015
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Environmental Scanning Electron Microscopy of the Dehydration of Gel Materials
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 792-793
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- August 2001
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Thickness-fringe Contrast Analysis of Defects in GaN
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- MRS Online Proceedings Library Archive / Volume 673 / 2001
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- 18 March 2011, P32.1
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- 2001
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The Construction of an EBSD Stage for the Electroscan E3 SEM
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 796-797
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- August 2000
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“Microscopic Explorations“: One Kit Many uses.
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 1174-1175
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- August 2000
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Horizontal Defects Parallel to the Interface in GaN Pyramids
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 734-735
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- August 1999
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Characterization of the Absolute Crystal Polarity across Twin Boundaries in Gallium Phosphide Using Convergent-Beam Electron Diffraction
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- Microscopy and Microanalysis / Volume 5 / Issue 3 / May 1999
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- 31 July 2002, pp. 173-186
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- May 1999
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Defects in GaN Pyramids Grown on Si(111) Substrates by Selective Lateral Overgrowth
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
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- 13 June 2014, pp. 179-184
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- 1999
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Microscopy & Microanalysis '99; Aug. 1-5, 1999, Portland, Oregon
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- Microscopy and Microanalysis / Volume 4 / Issue 5 / October 1998
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- 28 July 2005, pp. 517-518
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- October 1998
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Defects in GaN Pyramids Grown on Si(111) Substrates by Selective Lateral Overgrowth
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- MRS Online Proceedings Library Archive / Volume 537 / 1998
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- 15 February 2011, G3.13
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- 1998
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Environmental Scanning Electron Microscopy: - Advantages and Disadvantages
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 381-382
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- August 1997
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Characterization of Crystal Polarity Across Twin Boundaries in GaP
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 491-492
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- August 1997
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The Evolution of Sol-Gel Films in the Environmental Scanning Electron Microscope.
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- MRS Online Proceedings Library Archive / Volume 321 / 1993
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- 15 February 2011, 561
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- 1993
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Surface Steps on (100) MgO Foils Imaged by TEM, SEM and AFM
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- MRS Online Proceedings Library Archive / Volume 318 / 1993
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- 21 February 2011, 407
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- 1993
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The 45° grain boundaries in YBa2Cu3O7−δ
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- Journal of Materials Research / Volume 7 / Issue 5 / May 1992
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- 31 January 2011, pp. 1052-1059
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- May 1992
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Flat interfaces in zinc oxide-based varistor ceramics
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- Journal of Materials Research / Volume 7 / Issue 2 / February 1992
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- 31 January 2011, pp. 474-481
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- February 1992
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Image Simulations of Ge Twin Boundaries.
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- MRS Online Proceedings Library Archive / Volume 295 / 1992
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- 15 February 2011, 173
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- 1992
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High-Resolution Electron Microscopy of Olivine-Magnetite Interfaces.
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- MRS Online Proceedings Library Archive / Volume 280 / 1992
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- 25 February 2011, 553
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- 1992
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The Determination of Step Heights on the Non-Uhv Heat-Treated MgO (100) Surface by CBED
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- MRS Online Proceedings Library Archive / Volume 280 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 661
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- 1992
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