2 results
Depth profiling by Xrf with Variable Beam Geometry Applied to Thin Films in the Nanometer Region
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 675-682
- Print publication:
- 1995
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Determination of Thickness and Composition of Thin AlxGa1-xAs Layers on GaAs by Total Electron Yield (TEY)
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- Journal:
- Advances in X-ray Analysis / Volume 38 / 1994
- Published online by Cambridge University Press:
- 06 March 2019, pp. 127-137
- Print publication:
- 1994
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- Article
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