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Ion Beam Preparation Procedures for Three-dimensional SEM Resolved Kikuchi (EBSD) and Kossel Microdiffraction Analysis of Deformed Metals
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 840-841
- Print publication:
- August 2005
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3D Microscopy and Microanalysis of Au-Al Ultrasonic Bonds by Specific Ion Beam Processing Steps and Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1156-1157
- Print publication:
- August 2004
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Broad Ion Beam “Slope Cutting” Technique for Cross Sectional SEM Specimen Preparation of Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 496-497
- Print publication:
- August 2000
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An Updated Ion Polishing System for Tem Specimen Preparation of Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 480 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 263
- Print publication:
- 1997
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