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Ion Beam Preparation Procedures for Three-dimensional SEM Resolved Kikuchi (EBSD) and Kossel Microdiffraction Analysis of Deformed Metals

Published online by Cambridge University Press:  01 August 2005

W Hauffe ,
G Simons ,
K Kunze ,
E Langer  and
R J Mitro
W Hauffe
Affiliation:
Dresden University of Technology, Germany
G Simons
Affiliation:
ETH Zürich, Switzerland
K Kunze
Affiliation:
ETH Zürich, Switzerland
E Langer
Affiliation:
Dresden University of Technology, Germany
R J Mitro
Affiliation:
Gatan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 840 - 841
Copyright
© 2005 Microscopy Society of America