3 results
Atom Probe Tomography of III-Nitrides Based Semiconducting Devices
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 956-957
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Pre-sharpened Microtips: An Efficient Sample Preparation Method for Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 296-297
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Strucuture of Low Loss EELS in Hf and Zr Metal, Dioxides and Silicates
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 14-15
- Print publication:
- August 2008
-
- Article
- Export citation