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Image-based 3D Nanocrystallography by Means of Tilt Protocol/Lattice-Fringe Fingerprinting with Contemporary Side-entry Specimen Goniometers
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 632-633
- Print publication:
- August 2005
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Image-Based Nanocrystallography by Means of Tilt Protocol / Lattice Fringe-Fingerprinting: Proof of Principle on TiO2 Nanoparticles
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 576-577
- Print publication:
- August 2005
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Image-Based Nanocrystallography in Future Aberration-Corrected Transmission Electron Microscopes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 818 / 2004
- Published online by Cambridge University Press:
- 21 March 2011, M11.3.1
- Print publication:
- 2004
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Oxygen and Carbon Defect Characterization In Silicon by Sims
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- Journal:
- MRS Online Proceedings Library Archive / Volume 59 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 433
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- 1985
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