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Image-based 3D Nanocrystallography by Means of Tilt Protocol/Lattice-Fringe Fingerprinting with Contemporary Side-entry Specimen Goniometers
Published online by Cambridge University Press: 01 August 2005
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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
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- Research Article
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- © 2005 Microscopy Society of America
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