28 results
D.1 Efficacy, safety, and tolerability of subcutaneous efgartigimod in chronic inflammatory demyelinating polyneuropathy: results from the ADHERE trial
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- Canadian Journal of Neurological Sciences / Volume 51 / Issue s1 / June 2024
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- 24 May 2024, pp. S8-S9
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Being Praised for Prosocial Behaviors Longitudinally Reduces Depressive Symptoms in Early Adolescents: A Population-Based Cohort Study
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- European Psychiatry / Volume 66 / Issue S1 / March 2023
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- 19 July 2023, p. S330
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Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 514-515
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- July 2012
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Phase Reconstruction Of Electron Waves Using Diffractive Imaging
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1250-1251
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- July 2012
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Determination of a 3D Lattice Displacement Field by Iterative Phase Retrieval of Rocking Curves of HOLZ Reflections
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1114-1115
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- July 2011
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Analysis of Crystalline Nano Structures Embedded in Amorphous Films by Selected Area Nano Diffraction in a Cs-corrected TEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 760-761
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- July 2009
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Reconstruction of Atomic Columns in Silicon by Electron Diffractive Imaging
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 744-745
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- July 2009
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Spherical Aberration Corrected TEM/STEM Analysis of La2O3 Thin Film Deposited on Si (001) Substrate
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1010-1011
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- July 2009
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Cs-corrected STEM studies of Ge nanodots grown on slightly oxidized Si(001) surfaces
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 170-171
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- August 2008
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Depth Sensitivity of Cs-Corrected TEM Imaging
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 890-891
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- August 2007
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Direct Observation of Site Hopping of Individual Dopant Atoms in Si Crystal, by Cs-corrected STEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1186-1187
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- August 2007
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Practical Solution for Artificial Image Contrasts in Cs-corrected TEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 882-883
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- August 2007
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Present Status of Cs-corrected HRTEM and Future Prospects
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 158-159
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- August 2006
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Classification of Artifacts in 3D-TEM Tomography of FePt-MgO Crystalline Samples Studied by Multislice Image Simulation
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 302-303
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- August 2005
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Cross-sectional Observations of Surface Structures on MgO{100} by Cs-corrected TEM
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 2162-2163
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- August 2005
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Observation of Photo-decomposition Process of Poly-Hydrocarbons on Catalytic TiO2 Films Detected in Dedicated In-situ TEM
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 214-215
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- August 2005
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Experimental Observation of Formation Processes in Si/SiO2 Interface Defects Using in-situ UHV-ESR System
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- MRS Online Proceedings Library Archive / Volume 864 / 2005
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- 01 February 2011, E3.1
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- 2005
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DASI: The Degree Angular Scale Interferometer
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- Symposium - International Astronomical Union / Volume 201 / 2005
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- 26 May 2016, pp. 33-42
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- 2005
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New Possibility of Direct Observations of Quantum Dots, Nanotubes and Interfaces by Cs-Corrected HRTEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 06 August 2003, pp. 138-139
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- August 2003
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HRTEM and EELS Analysis of Interfacial Reactions in Ti/Si1-xGex/Si(100)
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 22 July 2003, pp. 470-471
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- August 2003
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