3 results
Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 8-9
- Print publication:
- August 2018
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The infrared absorption band at 3596 cm−1 of the recrystallized quartz from Mt. Takamiyama, southwest Japan
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- Journal:
- Mineralogical Magazine / Volume 63 / Issue 5 / October 1999
- Published online by Cambridge University Press:
- 05 July 2018, pp. 693-701
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Passage of Single Hydrocarbon Chains Through a Defect of Carbon Nanotube
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1170-1171
- Print publication:
- July 2009
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