4 results
Room-temperature diffusion of evaporated Fe atom into SOI materials characterized by scanning Kelvin-SPV method
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- Journal:
- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
- Published online by Cambridge University Press:
- 15 July 2004, pp. 487-489
- Print publication:
- July 2004
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Scanning kelvin-probe characterization of heavy metal contamination in patterned SIMOX wafers
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- Journal:
- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
- Published online by Cambridge University Press:
- 15 July 2004, pp. 491-493
- Print publication:
- July 2004
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Transient Capacitance Characterization of Deep Levels in Undoped and Si-Doped GaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 764 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, C3.39
- Print publication:
- 2003
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Electric Double- Layer Capacitor using Organic Electrolyte
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- Journal:
- MRS Online Proceedings Library Archive / Volume 496 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 627
- Print publication:
- 1997
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