5 results
Two-dimensional imaging of the potential distribution within a core/shell nanowire by electron holography
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- Journal:
- Journal of Materials Research / Volume 21 / Issue 5 / May 2006
- Published online by Cambridge University Press:
- 01 May 2006, pp. 1215-1220
- Print publication:
- May 2006
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Damage Caused by Transverse Scattering of Gallium during FIB Milling
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1170-1171
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- August 2004
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Specimen Preparation Considerations for 2D Dopant Profile Determination in Semiconductor Devices by Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 812-813
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- August 2003
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Multiple Orientation Relationships Among Nanocrystals of Manganese Oxides
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 19 July 2003, pp. 402-403
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- August 2003
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TEM Imaging of Amorphous Silicon Oxide - Silicon Nitride - Silicon Oxide Dielectric Films
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1228-1229
- Print publication:
- August 2001
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