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HIM-SIMS: Correlative SE/Chemical Imaging at the Limits of Resolution.
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 278-279
- Print publication:
- July 2017
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Secondary Ion Mass Spectrometry in the TEM: Isotope Specific High Resolution Correlative Imaging.
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 316-317
- Print publication:
- July 2017
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Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1859-1860
- Print publication:
- August 2015
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