6 results
Electron Field Emission Characterization of Nanocrystalline Diamond Thin Film Cold Cathode Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 593 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 227
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- 1999
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Development of preferred orientation in polycrystalline AlN thin films deposited by rf sputtering system at low temperature
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- Journal:
- Journal of Materials Research / Volume 12 / Issue 7 / July 1997
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1850-1855
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- July 1997
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Preparation of highly oriented polycrystalline AlN thin films deposited on glass at oblique-angle incidence
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- Journal:
- Journal of Materials Research / Volume 12 / Issue 7 / July 1997
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1689-1692
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- July 1997
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Structural Evolution of Top-Junction a-Si:C:H:B and Mixed-Phase (Microcrystalline Si)-(a-Sil-xCx:H) p-Layers in a-Si:H n-i-p Solar Cells
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- Journal:
- MRS Online Proceedings Library Archive / Volume 420 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 69
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- 1996
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Infrared optical properties of CVD diamond films
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- Journal:
- Journal of Materials Research / Volume 5 / Issue 11 / November 1990
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2345-2350
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- November 1990
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Intrinsic Stress in a-Germanium Films Deposited by RF-Magnetron Sputtering
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- Journal:
- MRS Online Proceedings Library Archive / Volume 130 / 1988
- Published online by Cambridge University Press:
- 22 February 2011, 355
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- 1988
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