3 results
Xe+ FIB Milling and Measurement of Amorphous Silicon Damage
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 862-863
- Print publication:
- August 2013
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A Comparison of Xenon Plasma FIB Technology with Conventional Gallium LMIS FIB: Imaging, Milling, and Gas-Assisted Applications
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 652-653
- Print publication:
- July 2011
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Strain Measurements at a NiSi/Si Interface Using STEM-CBED: A Quantifaction Method for Stress Relaxation During TEM Lamella Preparation
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 866-867
- Print publication:
- August 2003
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