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Multivariate Statistics in Microanalysis: From Abstract to Useful
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 906-907
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- July 2010
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Developing an X-ray Imaging Strategy
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 908-909
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- July 2010
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Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Microstructural Characterization with NIST Lispix
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1340-1341
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- August 2007
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Advances in Energy Dispersive X-ray Spectrometry: The Impact of Silicon Drift Detectors (SDD) on the Characterization of Nanostructures and Nanomaterials
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 578-579
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- August 2007
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Three-Dimensional Nanoscale Chemical Imaging via EFTEM Spectral Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1550-1551
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- August 2006
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