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Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Microstructural Characterization with NIST Lispix

Published online by Cambridge University Press:  05 August 2007

D Newbury ,
D Bright ,
JH Scott ,
J Michael  and
P Kotula
D Newbury
Affiliation:
National Institute of Standards and Technology
D Bright
Affiliation:
National Institute of Standards and Technology
JH Scott
Affiliation:
National Institute of Standards and Technology
J Michael
Affiliation:
Sandia National Laboratories
P Kotula
Affiliation:
Sandia National Laboratories
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1340 - 1341
Copyright
© 2007 Microscopy Society of America

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