3 results
Copper Diffusion Into Aluminum-Silicon Metallizations by Accelerated Thermal and Electrical Stressing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 219
- Print publication:
- 1996
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Characterization of Copper Diffusion into Al and Al-1% Si Polycrystalline Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 403 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 663
- Print publication:
- 1995
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- Article
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AFM/SEM Study of Thermally Induced Hillock Coalescence
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- Journal:
- MRS Online Proceedings Library Archive / Volume 356 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 489
- Print publication:
- 1994
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