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F23 A Novel TXRF Instrumentation for Contamination Control on 300 mm Silicon Wafers Employing Synchrotron Radiation
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- Journal:
- Powder Diffraction / Volume 18 / Issue 2 / June 2003
- Published online by Cambridge University Press:
- 20 May 2016, p. 177
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Electron Tomography of Meiotic Spindle Components in Caenorhabditis elegans
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 140-141
- Print publication:
- August 2005
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High-Voltage Electron Tomography of the Early C. elegans Mitotic Spindle
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 04 September 2003, pp. 384-385
- Print publication:
- September 2003
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