7 results
Characterization of Defect Formation during Ni Silicidation for CMOS Device Application
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2096-2097
- Print publication:
- August 2005
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Characterization of Photoluminescence From Anodically Etched SiC/Si Heterostructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 298 / 1993
- Published online by Cambridge University Press:
- 25 February 2011, 361
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- 1993
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Photoluminescence of Chemically Etched Polycrystalline and Amorphous Si Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 298 / 1993
- Published online by Cambridge University Press:
- 25 February 2011, 211
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- 1993
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Sub-Micron Selective Photoluminescence in Porous Si by Focused Ion Beam Implantation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 281 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 519
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- 1992
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Si Nanostructure Fabrication by Ga+ FIB Selective Doping and Anisotropic Etching
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- Journal:
- MRS Online Proceedings Library Archive / Volume 256 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 123
- Print publication:
- 1991
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Correlation Between Optical Absorption and Refractive Index of Silica and Silicate Glasses Implanted with Copper
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- Journal:
- MRS Online Proceedings Library Archive / Volume 152 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 115
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- 1989
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Modification of Optical Properties in Transition Metal Ion Implanted Silica
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- Journal:
- MRS Online Proceedings Library Archive / Volume 126 / 1988
- Published online by Cambridge University Press:
- 21 February 2011, 105
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- 1988
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