2 results
Ion-Irradiated Damage in Semiconductors Visualized by Means of Low-kV Scanning Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 486-487
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
The Influence of Growth Temperature on Oxygen Concentration in GaN Buffer Layer
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1068 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1068-C03-09
- Print publication:
- 2008
-
- Article
- Export citation