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Real-time in-situ Investigation of III-V Nanowire Growth using Custom-designed Hybrid Chemical Vapor Deposition-TEM
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1716-1717
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- July 2017
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Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires
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- Microscopy and Microanalysis / Volume 17 / Issue 5 / October 2011
- Published online by Cambridge University Press:
- 08 September 2011, pp. 752-758
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- October 2011
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High-Resolution TEM and the Application of Direct and Indirect Aberration Correction
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- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
- Published online by Cambridge University Press:
- 03 January 2008, pp. 60-67
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- February 2008
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Cs Corrector for Imaging
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 976-977
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- August 2004
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Cs Corrector for Illumination
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1004-1005
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- August 2004
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Sub-Ångstrom Resolution with a Mid-Voltage TEM
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- Journal:
- Microscopy Today / Volume 12 / Issue 3 / May 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 28-29
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- May 2004
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Laboratory Design for High-Performance Electron Microscopy
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- Journal:
- Microscopy Today / Volume 12 / Issue 3 / May 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-17
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- May 2004
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Simulated Image Maps for Use in Experimental High-Resolution Electron Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 159 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 453
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- 1989
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Preparation of Semiconductor Cross Sections by Cleaving
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- Journal:
- MRS Online Proceedings Library Archive / Volume 115 / 1987
- Published online by Cambridge University Press:
- 21 February 2011, 143
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- 1987
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