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Spatial Distribution of Neutral EL2 as Measured Optically for Thin Semi-Insulating GaAs Wafers, and Relevance to Device Parameters
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- Journal:
- MRS Online Proceedings Library Archive / Volume 46 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 219
- Print publication:
- 1985
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- Article
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