Powder Diffraction: Volume 21 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 21 - Issue 2 - June 2006

Contents

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Denver X-Ray Conference

D095 High resolution X-ray diffractometry and reflectometry in modern semiconductor manufacturing—invited
R. J. Matyi
Published online by Cambridge University Press:

20 May 2016, p. 174
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D056 Investigation of strain, relaxation degree, interface roughness and porosity of SiGe/Si modfet heterostructures — invited
A. Ulyanenkov, M. Myronov, Y. Shiraki, K. Saito
Published online by Cambridge University Press:

20 May 2016, p. 174
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D100 System for spatially resolved HRXRD
V. A. Kogan, A. V. Kharchenko
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20 May 2016, p. 174
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DO33 Kinetics and phase equilibria of the interactions of the Ba2YCu3O6 + x superconductor with CeO2 buffer layer
W. Wong-Ng, Z. Yang, L. P. Cook, I. Levin, Q. Huang, J. Frank
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20 May 2016, p. 174
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F34 Applications of X-ray reflectivity to develop and monitor feol and beol processes for sub-65nm technology nodes
E. Nolot
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20 May 2016, p. 174
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D017 High-energy X-ray methods for studying buried interfaces—invited
H. Reichert
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20 May 2016, p. 175
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D049 High pressure deformation study of zirconium
S. C. Vogel, D. W. Brown, H. Reiche, T. A. Sisneros, H. M. Volz, J. Zhang, Y. Zhao, N. Nishiyama, Y. Wang
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20 May 2016, p. 175
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D037 In-situ tensile loading study of grain size effect on deformation mechanism in nickel
A. D. Stoica, X.-L. Wang, C. T. Liu, D. Ma, Y. Ren, J. Almer
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20 May 2016, p. 175
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D051 Investigation of nano-scale deformation mechanisms in metallic multilayers by in-situ synchrotron X-ray diffraction
C. C. Aydiner, D. W. Brown, S. Vogel, Y. C. Wang, A. Misra, J. Almer
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20 May 2016, p. 175
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D077 Using high energy X rays and in situ loading to understand crystal stresses in polycrystalline metals
M. Miller, J.-S. Park, A. Kazimirov, P. Revesz, J. Bernier
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20 May 2016, p. 175
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D083 Depth-resolved strain determination of hydroxyapatite coatings using high energy X-ray diffraction
T. P. Ntsoane, M. Topic, T. Thovhogi, M. Härting, D. Robinson, R. B. Heimann
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20 May 2016, p. 175
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F53 Tube-based portable XRF meets the challenges of RoHS/WEEE compliance
B. Connors, B. Hubbard-Nelson, R. Koch, D. Sackett, B. Tannian, G. Waksman
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20 May 2016, p. 176
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F64 Improved beam collimation in portable XRF analyzer for analysis of small electronic components
S. Piorek
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20 May 2016, p. 176
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F66 Need for new X-ray fluorescence standards
J. B. Sardisco, B. H. Clampitt
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20 May 2016, p. 176
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F69 Certified reference materials: the heart of accurate XRF analysis
D. Geist, B. Britt, P. Dalager
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20 May 2016, p. 176
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F33 Forensics applications of X-ray fluorescence spectroscopy in combination with advanced light source sample discovery
S. Mamedov, J. Goldey, A. Whitley, N. Verzard
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20 May 2016, p. 176
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F61 Using a monochromatic-excitation EDXRF analyzer to measure trace elements in air particulates
N. Gao, Z. Chen, W. M. Gibson
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20 May 2016, p. 176
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F56 A review of two U.S. silica in-house XRF analytical routine assessments—invited
M. L. Paige
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20 May 2016, p. 176
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F59 XRF use in the phosphate industry—invited
T. Holland
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20 May 2016, p. 176
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F67 Development of a quantitative EDXRF method for determining the concentration of palladium applied to tobacco
J. Lipscomb, M. Chang, T. Danielson, C. Connell, S. Zimmermann
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20 May 2016, p. 176
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Powder Diffraction

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Volume 21 - Issue 2 - June 2006

Denver X-Ray Conference

D095 High resolution X-ray diffractometry and reflectometry in modern semiconductor manufacturing—invited

D056 Investigation of strain, relaxation degree, interface roughness and porosity of SiGe/Si modfet heterostructures — invited

D100 System for spatially resolved HRXRD

DO33 Kinetics and phase equilibria of the interactions of the Ba2YCu3O6 + x superconductor with CeO2 buffer layer

F34 Applications of X-ray reflectivity to develop and monitor feol and beol processes for sub-65nm technology nodes

D017 High-energy X-ray methods for studying buried interfaces—invited

D049 High pressure deformation study of zirconium

D037 In-situ tensile loading study of grain size effect on deformation mechanism in nickel

D051 Investigation of nano-scale deformation mechanisms in metallic multilayers by in-situ synchrotron X-ray diffraction

D077 Using high energy X rays and in situ loading to understand crystal stresses in polycrystalline metals

D083 Depth-resolved strain determination of hydroxyapatite coatings using high energy X-ray diffraction

F53 Tube-based portable XRF meets the challenges of RoHS/WEEE compliance

F64 Improved beam collimation in portable XRF analyzer for analysis of small electronic components

F66 Need for new X-ray fluorescence standards

F69 Certified reference materials: the heart of accurate XRF analysis

F33 Forensics applications of X-ray fluorescence spectroscopy in combination with advanced light source sample discovery

F61 Using a monochromatic-excitation EDXRF analyzer to measure trace elements in air particulates

F56 A review of two U.S. silica in-house XRF analytical routine assessments—invited

F59 XRF use in the phosphate industry—invited

F67 Development of a quantitative EDXRF method for determining the concentration of palladium applied to tobacco

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Volume 21 - Issue 2 - June 2006

Denver X-Ray Conference