Materials Science in High Magnetic Fields
Highly Correlated Electron Systems
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- 29 November 2013, pp. 23-28
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Trends in Materials Data: Regularities and Predictions
Trends in Advanced Materials Data: Regularities and Predictions
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- 29 November 2013, pp. 27-30
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Nanotribology
Tribological Investigations Using Friction Force Microscopy
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- 29 November 2013, pp. 26-34
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Technical Features
MoSi2-Based High-Temperature Structural Silicides
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- 29 November 2013, pp. 35-41
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Materials for Photovoltaics
Thin Polycrystalline Silicon Solar Cells
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- 29 November 2013, pp. 33-37
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Microwave Processing of Materials
Recent Developments in the Microwave Processing of Ceramics
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- 29 November 2013, pp. 41-46
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Trends in Materials Data: Regularities and Predictions
Theory and Practice in the Prediction of New Materials
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- 29 November 2013, pp. 31-37
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Smart Materials
Magnetostrictive Materials
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- 29 November 2013, pp. 34-41
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Copper Metallization
Copper Etching: New Chemical Approaches
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- 29 November 2013, pp. 39-45
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Nanotribology
Interfacial Junctions and Cavitation
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- 29 November 2013, pp. 36-44
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Environmental Stability of Materials
Environmental Stability of Materials—Issues and Opportunities
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- 29 November 2013, pp. 25-31
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Materials Reliability in Microelectronics
Electromigration and IC Interconnects
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- 29 November 2013, pp. 19-25
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Materials Science in High Magnetic Fields
Organic Conductors and Superconductors: New Directions in the Solid State
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- 29 November 2013, pp. 29-37
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Other
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- 29 November 2013, p. 40
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Special Feature
Materials in Mechanical Design
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- 29 November 2013, pp. 43-53
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Advanced Cement-Based Materials
Processing of Optimized Cements and Concretes Via Particle Packing
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- 29 November 2013, pp. 45-49
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Materials for Photovoltaics
Recent Progress in Amorphous Silicon Solar Cells and Their Technologies
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- 29 November 2013, pp. 38-41
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Smart Materials
Ceramic Actuators: Principles and Applications
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- 29 November 2013, pp. 42-48
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Quantitative Analysis of Thin Films
Scanning Probe Microscopy of Thin Films
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- 29 November 2013, pp. 41-49
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Materials Reliability in Microelectronics
Stress-Induced Void Formation in Metal Lines
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- 29 November 2013, pp. 26-35
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