Physical Sciences Symposia
Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
In-Situ EBIC STEM: Automated Quantification
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- 22 July 2022, pp. 1718-1719
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Characterization and Growth of Quad Unit Cell Linear Defects in Potassium Tantalate
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- 22 July 2022, pp. 1720-1721
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Nanoscale Engineering of Magnetic Textures in the Layered Magnet CrSBr Using Electrons and Helium Ions
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- 22 July 2022, pp. 1722-1723
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Real Space Demonstration of Electric Current-Induced Isolated Skyrmion Deformation
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- 22 July 2022, pp. 1724-1725
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Building Atomic and Plasmonic Devices via Electron Beams: from Desired Structures to Desired Properties
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- 22 July 2022, pp. 1726-1727
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Exploring the Cryogenic Phase Changes within 2D MoTe2 via TEM, 4DSTEM and Electron Spectroscopy Techniques
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- 22 July 2022, pp. 1728-1729
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Atomic-Scale Phase Transformation of CrCl3 Elucidated by Cryo-STEM
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- 22 July 2022, pp. 1730-1731
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In-situ Imaging of Thermally Activated Atomic Reconstruction of Twisted Bilayer Transition Metal Dichalcogenides
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- 22 July 2022, pp. 1732-1734
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Channeling-Induced Artifacts in Atom Tracking of Cations in Distorted Perovskites Imaged by HAADF-STEM
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- 22 July 2022, pp. 1736-1738
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Imaging Charged Domain Walls in a 2D Ferroelectric
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- 22 July 2022, p. 1740
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Universal Torsional Periodic Lattice Distortion in Twisted 2D Materials
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- 22 July 2022, pp. 1742-1744
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Layer Stacking Determination in Topological Semimetal MoTe2 via STEM Imaging, Liquid He TEM, and Quantitative Electron Diffraction
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- 22 July 2022, pp. 1746-1748
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Probing Changes in the Electronic Structure and Chemical Bonding of Ti3C2 MXene Sheets with Electron Energy-Loss Spectroscopy
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- 22 July 2022, pp. 1750-1751
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Mapping pm-scale Lattice Distortions and Measuring Interlayer Separations in Stacked 2D Materials by Interferometric 4D-STEM
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- 22 July 2022, pp. 1752-1754
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Probing Sources of Decoherence at Defects and Interfaces in Superconducting Quantum Materials and Devices
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- 22 July 2022, pp. 1756-1757
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Uncovering the Role of Ordering in MoSi Superconducting Nanowire Single Photon Detectors with 4D STEM
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- 22 July 2022, pp. 1758-1760
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Autonomous Detection and Identification of Defects in Nanoscale Devices using Electron Diffraction Imaging
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- 22 July 2022, pp. 1762-1763
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Direct Measurement of Atomic Reconstruction, Strain, and Disorder in Moiré Materials using 4D-STEM
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- 22 July 2022, pp. 1764-1766
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Extending Bragg Interferometry for the Study of Magic Angle Trilayer Graphene
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- 22 July 2022, pp. 1768-1769
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Probing Three-dimensional Chiral Domain Walls in Polar Vortices
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- 22 July 2022, pp. 1770-1771
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