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Channeling-Induced Artifacts in Atom Tracking of Cations in Distorted Perovskites Imaged by HAADF-STEM

Published online by Cambridge University Press:  22 July 2022

Michelle A. Smeaton
Affiliation:
Department of Materials Science & Engineering, Cornell University, Ithaca, NY, United States
Noah Schnitzer
Affiliation:
Department of Materials Science & Engineering, Cornell University, Ithaca, NY, United States
Hong Zheng
Affiliation:
Materials Science Division, Argonne National Laboratory, Lemont, IL, United States
John F. Mitchell
Affiliation:
Materials Science Division, Argonne National Laboratory, Lemont, IL, United States
Lena F. Kourkoutis*
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY, United States Kavli Institute for Nanoscale Science, Cornell University, Ithaca, NY, United States
*
*Corresponding author: [email protected]

Abstract

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Type
Quantum Materials Under Electron Beam: From Atomic Structures to Working Devices
Copyright
Copyright © Microscopy Society of America 2022

References

Catalan, G., et al. , Nat. Mater. 10 (2011), p. 963.10.1038/nmat3141CrossRefGoogle Scholar
El Baggari, I., et al. , Prov. Natl. Acad. Sci. U.S.A. 115 (2018), p. 1445.Google Scholar
Savitzky, B.H., et al. , Nat. Comm. 8 (2017), p. 1883.10.1038/s41467-017-02156-1CrossRefGoogle Scholar
P. Voyles, , et al. , Ultramicroscopy 96 (2003), p. 251.10.1016/S0304-3991(03)00092-5CrossRefGoogle Scholar
Kirkland, E.J., et al. , Ultramicroscopy 23 (1987), p. 77.10.1016/0304-3991(87)90229-4CrossRefGoogle Scholar
This work was supported by NSF (DMR-1719875, DGE-1650441, DMR-2039380). Work performed at Argonne National Laboratory (crystal growth and post-annealing studies) was sponsored by the U.S. DOE, Office of Science, Basic Energy Sciences, Materials Science and Engineering Division.Google Scholar