One-dimensional Nanomaterials: Microscopy and Nano-measurements
Research Article
TEM Characterization of CdSe Quantum Dot Sensitized ZnO Nanowires
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- 05 August 2007, pp. 756-757
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Characterization of Gold on Silicon Nanowires using Aberration-corrected STEM
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- 05 August 2007, pp. 758-759
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In-Situ Observation of Nano-Ribbon Growth During Pd/Ru(0001)Epitaxy
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- 05 August 2007, pp. 760-761
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Three-Dimensional Characterization of Core/Shell Nitride Nanowires
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- 05 August 2007, pp. 762-763
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Templated Synthesis and Electron Microscopy Characterization of Pt Nanoparticles via Carbon Nanotube/DNA Molecules
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- 05 August 2007, pp. 764-765
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Annealing Study of Porous Tungsten Oxide Nanostructures
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- 05 August 2007, pp. 766-767
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Synthesis and Characterization of Antimony-doped Tin Oxide Nanostructures
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- 05 August 2007, pp. 768-769
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Advanced Methods of Nanowire and Nano-Device Analysis
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- 05 August 2007, pp. 770-771
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Fabrication and Characterization of Selectively Patterned MgO Nanowires
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- 05 August 2007, pp. 772-773
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Formation of Carbon Nanofilaments by Metal Dusting
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- 05 August 2007, pp. 774-775
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Effect of Synthesis Parameters on the Gold Nanostructures Produced using an Oleamine Reductant
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- 05 August 2007, pp. 776-777
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HRTEM Study of Titania Nanotubes Grown by Low Temperature Hydrothermal Synthesis
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- 05 August 2007, pp. 778-779
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An in situ TEM Study of Field Emission of Electrons from LaB6 Nanowires
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- 05 August 2007, pp. 780-781
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An Electron Diffraction RDF Study of Amorphous Boron Nanowires
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- 05 August 2007, pp. 782-783
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Diameter Dependence of Ge-doped Si Nanowires Fabricated via Vapor-Liquid-Solid Growth
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- 05 August 2007, pp. 784-785
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High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development
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TEM Contributions to Silicon Technology Advancement
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- 05 August 2007, pp. 786-787
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Transmission Electron Microscopy of TiW/Ti/Pt/Au Gate Metallizations for InAs Channel High Electron Mobility Transistors
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- 05 August 2007, pp. 788-789
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A Method for Site-specific Specimen Preparation of Si Device after 65 nm-node Technology using FIB-STEM/TEM System
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- 05 August 2007, pp. 790-791
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Thermally Driven Chemical Diffusion and Failure of InGaAs-AlGaAs Strained Single Quantum Well Laser Diodes
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- 05 August 2007, pp. 792-793
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TEM-EELS Study on the Ash Damage and Repair of Porous Low-k Films
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- 05 August 2007, pp. 794-795
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