Analytical and Instrumentation Science Symposia
Sterling Newberry Memorial Symposium on X-ray Imaging
Abstract
Micro-Focused Five Dimensional X-ray Imaging with the Color X-ray Camera
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 986-987
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A New Method for Characterizing 3D Microstructures Using Lab-based Diffraction Contrast Tomography
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- 01 August 2018, pp. 988-989
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X-ray Detectors - in Heaven and on Earth
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 990-991
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Combining 3D X-ray Techniques; Computed Tomography and Fluorescence
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- 01 August 2018, pp. 992-993
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Blob-based Algebraic Reconstruction Technique for Computed Laminography
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 994-995
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Next Generation of Instruments Required - Not just X-Ray Imaging but Combined EDS, CL, GSR, XRM, XRD and Raman Systems
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 996-997
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In situ Dynamic X-ray Tomography in the Laboratory
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 998-999
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Soft X-ray Microscopy: History, Status, and Future
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1000-1001
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In situ Imaging of Materials using X-ray Tomography
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1002-1003
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Using Micro-Computed Tomography to Investigate Powder Distribution Trends Within 3D Binder-Jet Printed SS316 Parts
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1004-1005
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High-efficiency Fast X-Ray Imaging Detector Development at SSRF
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1006-1007
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Novel sub-eV high throughput laboratory micro-XAS (x-ray absorption spectrometer) for chemical state analysis through XANES and EXAFS
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1008-1009
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4D and In Situ X-ray Microscopy for Studying Damage Evolution in Materials Across Multiple Length Scales
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1010-1011
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Full-field X-ray Nano-scope Developed at SSRF
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1012-1013
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Surface and Subsurface Microscopy and Microanalysis
Abstract
What do Cells and Photovoltaic Materials Have in Common? TOF-SIMS Tandem MS Imaging and the Identification of Chemistry at < 100 nm Resolving Power
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1014-1015
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Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials
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- 01 August 2018, pp. 1016-1017
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Surface Characterization of Biologically Related Systems with Imaging TOF-SIMS and Complementary Techniques
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- 01 August 2018, pp. 1018-1019
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Ablation and Microstructure Imaging of Dentin-Enamel Junction Using Focused Electron Beam in an Environmental Scanning Electron Microscope
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1020-1021
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Imaging the Endoplasmic Reticulum within Individual Mammalian Cells with Secondary Ion Mass Spectrometry
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1022-1023
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Improving the Understanding of Catalytic Processes using Field Emission Techniques: The Case of NO+H2 on Pd-Au.
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1024-1025
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