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4D and In Situ X-ray Microscopy for Studying Damage Evolution in Materials Across Multiple Length Scales

Published online by Cambridge University Press:  01 August 2018

Will Harris ,
Hrishikesh Bale ,
Steve Kelly  and
Benjamin Hornberger
Will Harris
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA
Hrishikesh Bale
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA
Steve Kelly
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA
Benjamin Hornberger
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1010 - 1011
Copyright
© Microscopy Society of America 2018 

References

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