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Volume 12 - August 2006

Contents

Page 48 of 50

Digital Imaging and Measurements

Abstract

  • Image Analysis of Off-Eutectic Alloys with Lamellar Microstructures

  • D Susan, C Robino, J DuPont, M Minicozzi
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1684-1685
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Darkfield Brightfield and Energy-Filtered Nanotube Image Profiles

  • E Mandell, P Fraundorf, S Lin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1686-1687
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • RIMAPS and Variogram Characterization of Soil Microstructure Patterns

  • EA Favret, NO Fuentes, HJ M Morrás
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1688-1689
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • A General Approach to Unit-cell Determination in Electron Diffraction Experiments

  • XZ Li
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1690-1691
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Microscopy, Imaging and Training in the Digital Age

Abstract

  • Preparing the Next Generation: Implementing Instructional Microscopy Technology Developed by NASA Kennedy Space Center

  • T Schroeder
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1692-1693
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Using Microscopy Simulations in High School Teaching and Learning: Research from Low Income Schools and What it Means for Development

  • L Blasi
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1694-1695
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Assessment of WebSEM K-12 Outreach Efforts

  • A Chumbley, S Chumbley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1696-1697
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Serious Gaming – Teaching Science Using Games

  • V Giasolli, M Giasolli, R Giasolli, A Girasoli
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1698-1699
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Nanoworld Webquests with Peer Review

  • P Fraundorf, K Stine
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1700-1701
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Centre for Ultrastructural Imaging, King¡¦s College London

  • H Cook, A Brain, D Lovell, J Storey, F Winning, K Brady, A Warley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1702-1703
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Internet-based Administration of Instruments, Usage and Accounting in Shared Facilities

  • S-Y Li, VP Dravid
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1704-1705
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • The North Texas Advanced Research and Technology Institute: Instrumentation for Materials Characterization and Education

  • B Gorman, M Kaufman
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1706-1707
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Major Analytical Instrumentation Center: A Multi User Materials Characterization and Analysis Facility

  • L Dempere
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1708-1709
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Electron Holography

Abstract

  • Electron Holography Studies of Amorphous Materials

  • X Chen, D Miller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1710-1711
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Phase Shifting Reconstruction for High Resolution Electron Holography

  • K Yamamoto, MR McCartney, DJ Smith
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1712-1713
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Comparative Study of Dopant Profiling by Electron Holography, Scanning Capacitance Microscopy, and Secondary-Ion Mass Spectrometry

  • Z Wang, D Li
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1714-1715
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Examining the Sensitivity of Electron Holography for Two-Dimensional p-n Junction Mapping

  • Z Wang, D Li
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1716-1717
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Observation of Compound Semiconductor P-N Junction by Electron Holography

  • H Sasaki, K Yamamoto, T Hirayama
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1718-1719
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Atom Probe Field Ion Microscopy

Abstract

  • Advantages of the Local Electrode for Atom Probe Tomography Applications.

  • R Ulfig, DJ Larson, TF Kelly
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1722-1723
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Page 48 of 50