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Atomic Scale Compositional and Structural Characterization of Nanostructured Materials Using Combined FIB, STEM, and LEAP

Published online by Cambridge University Press:  31 July 2006

B Gorman ,
D Diercks ,
M Kaufman ,
R Ulfig ,
D Lawrence ,
K Thompson  and
D Larson
B Gorman
Affiliation:
University of North Texas
D Diercks
Affiliation:
University of North Texas
M Kaufman
Affiliation:
University of North Texas
R Ulfig
Affiliation:
Imago Scientific Instruments
D Lawrence
Affiliation:
Imago Scientific Instruments
K Thompson
Affiliation:
Imago Scientific Instruments
D Larson
Affiliation:
Imago Scientific Instruments

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1720 - 1721
Copyright
© 2006 Microscopy Society of America