In Situ and other Advanced Microscopy and Microanalysis of Catalytic Materials: Nanoparticles and Porous Solids for Catalysis, Energy and Environment
Abstract
Microscopic Characterization of Dendrimer-Derived Bimetallic Pt-Cu Catalysts
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- 31 July 2006, pp. 798-799
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SEM and TEM Study of MTO Catalyst Molecular Sieve ZSM-5
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- 31 July 2006, pp. 800-801
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Mg3(VO4)2: Insight Into Catalytic Behavior Through Single Crystal Studies
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- 31 July 2006, pp. 802-803
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Transmission Electron Microscopy Yields Clues to Platinum Particle Growth Phenomena in Fuel Cell Electrodes
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- 31 July 2006, pp. 804-805
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Characterization of Catalytic Supports by Means of High-Resolution TEM and SEM in Combination with Shadow-Casting and Decoration Procedures
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- 31 July 2006, pp. 806-807
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Depth Dependent Oxidation States in a PtRu Thin Film
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- 31 July 2006, pp. 808-809
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TEM (HREM) and STEM (HAADF/EDS) Study of the Metallic Dispersion in Supported Ruthenium Catalysts
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- 31 July 2006, pp. 810-811
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Catalytic Nanocrystals Electrochemically Formed in Active Mesoporous Nanocomposites
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- 31 July 2006, pp. 812-813
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Forsterite Formed on MgO Single Crystals During In-Situ Annealing
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- 31 July 2006, pp. 814-815
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Ex-Situ TEM Sulfidation Study of Supported Copper Particles
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- 31 July 2006, pp. 816-817
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Quantitative X-ray Microanalysis: A Symposium Honoring Art Chodos
Abstract
X-ray Mapping Is 50 Years Young; the Best Is Yet to Come; the Future Is Now!
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- 31 July 2006, pp. 818-819
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Crystal Chemistry Inspired Element Ratio Mapping Improves the Understanding of Petrogenesis: Martian Meteorite Examples
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- 31 July 2006, pp. 820-821
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Al and Mg Kα Shifts in Common Silicate and Oxide Minerals: Relevance to Achieving the Goal of 1% Accuracy in EPMA
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- 31 July 2006, pp. 822-823
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Core Community Specifications for Purchasing and Acceptance of Electron Beam Instruments
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- 31 July 2006, pp. 824-825
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Calibration Issues and Operating System Requirements for Electron-Probe Microanalysis
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- 31 July 2006, pp. 826-827
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Bence-Albee Corrections and Secondary Standards A Part of Art Chodos' Legacy of High Quality Microprobe Analysis that Needs to be Revived
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- 31 July 2006, pp. 828-829
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New Measurements of Deconvoluted EDS Spectra of Elemental Standards as a Function of Atomic Number and Electron Beam Energy
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- 31 July 2006, pp. 830-831
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Quantitative Analysis on an Electron Probe with the NIST Transition Edge Sensor Microcalorimeter X-ray Detector
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- 31 July 2006, pp. 832-833
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From Mineral Grain to Mountain Range: X-ray Microanalysis, Geochronology, and Himalayan Geology
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- 31 July 2006, pp. 834-835
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The Significance of Refractive Index “K”¨ Values of 45 to 200 Å 2d LSMs, or, Why Your Long Wavelength Peak Markers May Not Line Up Correctly
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- 31 July 2006, pp. 836-837
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