Microscopy and Microanalysis: Volume 18 -

New Results with Next Generation Solid State Backscattered Electron Detectors
A. Liebel, H. Soltau, R. Eckhardt, O. Jaritschin, A. Niculae, F. Schopper
Published online by Cambridge University Press:

23 November 2012, pp. 1206-1207
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A new high performance electron source for electron microscopes
M.M. El-Gomati
Published online by Cambridge University Press:

23 November 2012, pp. 1208-1209
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Using GPGPU techniques for Scanning Electron Microscope autofocusing
N.H. Caldwell, M. Li, B.C. Breton, D.M. Holburn
Published online by Cambridge University Press:

23 November 2012, pp. 1210-1211
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

To Cc or Not to Cc: That is the Question!
N.J. Zaluzec, D.J. Miller, J. Wen, R.E. Cook
Published online by Cambridge University Press:

23 November 2012, pp. 1212-1213
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Focal Series Reconstruction in Annular Dark-Field STEM
L. Jones, P.D. Nellist
Published online by Cambridge University Press:

23 November 2012, pp. 1214-1215
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Active machine learning method for identification of cell types in multiplex-stained histopathology specimens imaged by multi-spectral microscopy
R. Padmanabhan, V. Somasundar, B. Roysam, X. Liao, L. Carin, J. Hu, J. Zhu, W. Lee
Published online by Cambridge University Press:

23 November 2012, pp. 1216-1217
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Deep tissue fluorescence imaging using time-reversed light
Y.M. Wang, B. Judkewitz, C. Yang, M. Cui, C. DiMarzio
Published online by Cambridge University Press:

23 November 2012, pp. 1218-1219
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Chip-scale Microscopy for On-chip Cell Monitoring
G. Zheng, S.A. Lee, X. Ou, Y. Antebi, M.B. Elowitz, C. Yang
Published online by Cambridge University Press:

23 November 2012, pp. 1220-1221
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Scalable and Configurable Multi-pixel CMOS Photon Detector for the Scanning Electron Microscope
J. Chuah, D. Holburn
Published online by Cambridge University Press:

23 November 2012, pp. 1222-1223
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

New Results from SDD Detectors with Minimized Input Capacitance
J. Treis, R. Eckhardt, S. Jeschke, L. Mungenast, H. Soltau, K. Heinzinger, K. Hermenau, G. Krenz, P. Lechner, G. Lutz, F. Schopper, L. Strüder
Published online by Cambridge University Press:

23 November 2012, pp. 1224-1225
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Determining the Chemical and Microstructural Distribution of Phases in Real-time Using Tru-Q and Tru-I Technology
N. Rowlands, S. Burgess, J. Goulden, A. Hyde
Published online by Cambridge University Press:

23 November 2012, pp. 1226-1227
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A Microcalorimeter Spectrometer for High-Resolution X-ray Microanalysis
R. Cantor, H. Naito, R. Terborg
Published online by Cambridge University Press:

23 November 2012, pp. 1228-1229
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Comparison Of Transparent Windows For X-ray Radiation Detectors
M. Bornschlegl, A. Niculae, O. Jaritschin, B. Schweinfest, H. Soltau, L. Andricek
Published online by Cambridge University Press:

23 November 2012, pp. 1230-1231
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Post-processing of STEM Data for Instability and Drift Compensation
L. Jones, P.D. Nellist
Published online by Cambridge University Press:

23 November 2012, pp. 1232-1233
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Nanomorphology of P3HT:PCBM-based Organic Solar Cells Analyzed by Low-Energy Scanning Transmission Electron Microscopy
M. Pfaff, E. Müller, P. Müller, D. Gerthsen, M.G. Klein, A. Colsmann, U. Lemmer
Published online by Cambridge University Press:

23 November 2012, pp. 1234-1235
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Development of a New Specimen Holder for Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Polymer Systems
B.S. Patel, M. Watanabe
Published online by Cambridge University Press:

23 November 2012, pp. 1236-1237
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Turbo-Pumped Remote Plasma Cleaning for Faster SEM Contamination Removal
C.G. Morgan, R. Vane
Published online by Cambridge University Press:

23 November 2012, pp. 1238-1239
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Utility of the Hitachi ‘ZONE’ UV cleaning system for mitigating contamination effects during STEM imaging
D. Cullen, L.F. Allard
Published online by Cambridge University Press:

23 November 2012, pp. 1240-1241
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

RIMAPS Analysis of Filtered Images
E. Favret, B. Pidal
Published online by Cambridge University Press:

23 November 2012, pp. 1242-1243
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Particle Size and Shape of Polytetrafluoroethylene (PTFE) powders using Static and Dynamic Image Analysis
P. Bajaj, O. Guise
Published online by Cambridge University Press:

23 November 2012, pp. 1244-1245
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Volume 18 - October 2012

Instrumentation Symposium

Detectors, Correctors, and Analysis Methods-01

Research Article

New Results with Next Generation Solid State Backscattered Electron Detectors

A new high performance electron source for electron microscopes

Using GPGPU techniques for Scanning Electron Microscope autofocusing

Detectors, Correctors, and Analysis Methods-02

Research Article

To Cc or Not to Cc: That is the Question!

Focal Series Reconstruction in Annular Dark-Field STEM

Active machine learning method for identification of cell types in multiplex-stained histopathology specimens imaged by multi-spectral microscopy

Deep tissue fluorescence imaging using time-reversed light

Detectors, Correctors, and Analysis Methods-03

Research Article

Chip-scale Microscopy for On-chip Cell Monitoring

Scalable and Configurable Multi-pixel CMOS Photon Detector for the Scanning Electron Microscope

New Results from SDD Detectors with Minimized Input Capacitance

Vendor Symposium-01

Research Article

Determining the Chemical and Microstructural Distribution of Phases in Real-time Using Tru-Q and Tru-I Technology

Detectors, Correctors, and Analysis Methods-03

Research Article

A Microcalorimeter Spectrometer for High-Resolution X-ray Microanalysis

Comparison Of Transparent Windows For X-ray Radiation Detectors

Post-processing of STEM Data for Instability and Drift Compensation

Nanomorphology of P3HT:PCBM-based Organic Solar Cells Analyzed by Low-Energy Scanning Transmission Electron Microscopy

Development of a New Specimen Holder for Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Polymer Systems

Turbo-Pumped Remote Plasma Cleaning for Faster SEM Contamination Removal

Utility of the Hitachi ‘ZONE’ UV cleaning system for mitigating contamination effects during STEM imaging

RIMAPS Analysis of Filtered Images

Particle Size and Shape of Polytetrafluoroethylene (PTFE) powders using Static and Dynamic Image Analysis

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 18 - October 2012

Instrumentation Symposium

Detectors, Correctors, and Analysis Methods-01

Research Article

Detectors, Correctors, and Analysis Methods-02

Research Article

Detectors, Correctors, and Analysis Methods-03

Research Article

Vendor Symposium-01

Research Article

Detectors, Correctors, and Analysis Methods-03

Research Article