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Utility of the Hitachi ‘ZONE’ UV cleaning system for mitigating contamination effects during STEM imaging

Published online by Cambridge University Press:  23 November 2012

D. Cullen  and
L.F. Allard
D. Cullen
Affiliation:
ORNL, Oak Ridge, TN
L.F. Allard
Affiliation:
ORNL, Oak Ridge, TN
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1240 - 1241
Copyright
Copyright © Microscopy Society of America 2012

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